Auriga FEG-FIB
Publication date: 25/04/2025
Research
Equipment configuration:
| Technical specs | SEM | FIB |
Resolution | 1.0 nm @ 15 kV 1.9 nm @ 1 kV | < 2.5 nm @ 30 kV |
Magnification | 12x — 1,000,000x | 300x — 500,000x |
Beam current | 4 pA — 20 nA | 1 pA — 20 nA |
Voltage | 0.1 — 30 kV | 1.0 — 30 kV |
Emission | Schottky field emission diode | Ga LMIS + Pt GIS |
Electron detectors | In-Lens, SESI, ESB, NTS-BSD | |
X-ray detectors | Bruker Quanta 200 EDX detector EDAX Octane Elite Super 70 mm2 EDX detector Pegasus Velocity Pro EBSD detector | |
Service:
The platform is accessible to external users, whether from the academic sector (university, CNRS, EPST, EPIC, grand établishments, etc.), the public sector (ministries, agencies, museums, police, army, etc.) or the private sector (industry, services, etc.).
Reception and images/analysis are carried out by the technical manager.
In some cases, experienced users can access and work independently on the instruments.
In certain cases, the presence of customers is not mandatory. Samples can be sent for imaging and analysis, as long as the protocol is clearly established and simple enough not to require the customer’s presence.
We offer a “service” package including interpretation and validation of results.
Internal (IPGP) and academic rates are identical (plus management fees for external clients) and set annually by the IPGP Board of Directors. Other rates are negotiated on a case-by-case basis with the administrative manager.
Sessions are booked through the technical manager.
Any session scheduled and cancelled at the last minute may be invoiced, for example if it proves impossible to replace it.
